AXEL
Advanced X-ray and Electron Laboratory
About AXEL
AXEL is an instrumentation facility located in the University Research Centre (URC) at the University of Calgary. We support internal researchers, external academic collaborators, government/public-sector agencies, startups, and industry partners with advanced X-ray Photoelectron Spectroscopy (XPS) and Transmission Electron Microscopy (TEM) characterization services.
Our expertise spans diverse material systems including:
- Metals and alloys
- Oxides and ceramics
- Polymers and biomaterials
- Semiconductors and nanomaterials
- Coatings and catalysts
We provide both analytical services and expert consultation to help users obtain meaningful, high-quality data.
Our Capabilities
Have other materials characterization needs? Check out our sister facility: RITS Lab
X-ray Photoelectron Spectroscopy (XPS)
X-ray Photoelectron Spectroscopy (XPS) is one of the most widely used surface-analysis techniques for understanding the chemistry of solid materials. By irradiating a material with monochromated X-rays and measuring the kinetic energies of emitted photoelectrons, XPS provides surface-sensitive information on elemental composition, chemical states, bonding environments, oxidation states, and electronic structure from the top ~1–10 nm of a material.
At AXEL, XPS analysis is performed using a Thermo Scientific ESCALAB QXi XPS Microprobe, a highly sensitive, multi-technique surface-analysis platform designed for advanced spectroscopy, small-area analysis, XPS imaging, and depth profiling. The system supports micro-focused monochromated Al Kα and Ag Lα X-ray sources, selectable analysis areas, charge neutralization for insulating samples, and both monoatomic and gas-cluster Ar⁺ ion sources for in-situ surface cleaning and depth profiling of suitable materials.
What XPS can help determine
- Surface elemental composition and atomic percentages
- Chemical states, oxidation states, and bonding environments
- Surface contamination, oxidation, passivation, and functional groups
- Differences between treated, untreated, coated, aged, or modified surfaces
- Surface chemistry changes after processing, exposure, or cleaning.
- Valence-band and near-surface electronic-structure information, when required
XPS supports surface chemistry studies across a wide range of academic, industrial, and applied research areas, including:
- Materials Science and Metallurgy: Thin films, coatings, adhesion layers, surface treatments, corrosion products, passivation, and oxidation of metals and alloys.
- Energy Storage and Conversion: Battery electrodes, solid-electrolyte interphases, supercapacitors, fuel cells, solar cells, electrocatalysts, and photoelectrodes.
- Catalysis: Catalyst surfaces, active-site chemistry, support materials, oxidation states, adsorbed species, and changes after reaction, aging, or regeneration.
- Nanomaterials and Carbon-Based Materials: Graphene, carbon nanotubes, MXenes, carbon black, carbon papers, activated carbon, nanoparticles, quantum dots, and functionalized surfaces.
- Micro- & Nano-electronics: Wafers, thin films, native oxides, interfaces, dopants, surface contamination, and semiconductor materials.
- Polymers, Coatings, and Surface Modification: Functional groups, plasma or chemical treatments, polymer coatings, adhesion, degradation, oxidation, and surface contamination.
- Biomedical and Biomaterials Research: Implant materials, biosensors, antimicrobial coatings, biocompatible coatings, and biomaterial interfaces.
- Environmental, Mineral, and Construction Materials: Minerals, soils, oxides, adsorbents, carbon materials, cement-based materials, silicates, carbonates, and contaminant interactions.
- Ceramics, Glass, Cement, and Composite Materials: Surface composition, silicates, carbonates, oxides, hydration products, coatings, fillers, fibers, interfacial chemistry, and treated or aged surfaces.
- Product Development, Failure Analysis, and Quality Control: Comparison of treated and untreated surfaces, identification of surface contamination, verification of coating chemistry, assessment of cleaning or processing effects, and troubleshooting of unexpected surface chemistry.
Instrumentation
Thermo Scientific ESCALAB QXi XPS Microprobe
Key instrument features include:
- Micro-focused monochromated X-ray source with Al Kα and Ag Lα excitation options
- Selectable analysis areas from approximately <200 µm to >900 µm
- Small-area spectroscopy for features down to approximately 20 µm, depending on sample geometry, signal intensity, and analysis requirements.
- Monoatomic Ar⁺ and gas-cluster Ar⁺ ion sources for in-situ surface cleaning and depth profiling of suitable materials.
- Charge neutralization system for insulating or poorly conducting samples
- Ultra-high-vacuum analysis chamber capable of reaching base pressures in the 10⁻¹¹ mbar range.
Sample Requirements
✅ Fully dry, stable, and vacuum-compatible samples
✅ Clearly labeled and securely packaged
✅ Powders, thin films/coatings, pressed pellets, wafers, diced chips, foils, coupons, bulk solids, fibers, membranes, and small 3D parts with an accessible flat area
❌ Liquids, wet samples, oily/greasy, or strongly outgassing samples
Fees
| Item | Internal | External |
|---|---|---|
| Operator Time | $70/hr | $105/hr |
| Instrument Time | $50/hr | $75/hr |
| Overhead | N/A | 45% |
Resources
- Download the latest CasaXPS: http://www.casaxps.com/berlin/index.html
- The CasaXPS YouTube channel with step-by-step tutorials and training videos: https://www.youtube.com/channel/UCUqLBeW-UAjXC55HbRYOabQ
- The CasaXPS official site, which contains instructional videos, example VAMAS files used in tutorials, and links to journal papers related to the data shown in those videos: https://www.casa-software.com/
Transmission Electron Microscopy (TEM)
TEM is a powerful nanoscale characterization technique that enables high-resolution imaging, crystallographic analysis, and chemical characterization down to the atomic scale.
AXEL provides TEM services to academic, industrial, and government users across a wide range of materials systems.
Instrumentation
Talos™ F200X G2 Transmission Electron Microscope
- 200 kV accelerating voltage
- Field emission gun (X-FEG)
- Resolution: ≤0.12 nm (STEM)
- Integrated Super-X EDS and EELS detectors
Future Capabilities:
- In-situ electrochemical TEM
- Heating experiments
- Environmental TEM
Sample Requirements
✅ Electron-transparent samples (<100 nm thickness)
✅ Clean, dry, contamination-free
Fees
| Service | Internal | External |
|---|---|---|
| Operator Time | $70/hr | $105/hr |
| Instrument Time | $80/hr | $120/hr |
| TEM Grid Preparation | $10/grid | $10/grid |
| Overhead | N/A | 45% |
Resources
- STEM Microscope | Talos F200X G2 TEM | Thermo Fisher Scientific - CA
- Calculating Interplanar Spacing (d) from HRTEM Image: https://www.youtube.com/watch?v=w0rUiXHZePI&t=229s
- SAED Dot Pattern (SADP) indexing: https://www.youtube.com/watch?v=oiS7Gk3Iw0Q
- How to set up fast DualEELS for live mapping in DigitalMicrograph: https://www.youtube.com/watch?v=5FyYgZgV3AM&list=PL_kL-ZJRE__jnPmLAosJaFyoGXikqDIaT
How to Request Analysis
Complete Forms
Complete the appropriate sample submission form and email to relevant instrument contact.
External parties: A signed Service Agreement is additionally required prior to sample submission.
Submit Samples
Prepare and label samples according to requirements. Coordinate drop-off or shipment with lab staff.
Results
Data acquisition and reporting will follow consultation
Contact AXEL
Our Team
Dr. Ahmed Abdellah
TEM Specialist | Research Scientist
Ahmed is the TEM Specialist for the AXEL facility at the University of Calgary, where he supports academic researchers, external collaborators, startups, and industry partners with advanced electron microscopy and materials characterization services. He has extensive research experience in nanomaterials, heterogeneous catalysis, electrochemical CO₂ reduction, and in-situ/operando characterization techniques.
His characterization expertise spans a broad range of electron microscopy methods, including Transmission Electron Microscopy (TEM), Scanning Transmission Electron Microscopy (STEM), Energy-Dispersive X-ray Spectroscopy (EDS), Electron Energy Loss Spectroscopy (EELS), Selected Area Electron Diffraction (SAED), electron tomography, and in-situ liquid-cell TEM. Ahmed specializes in correlating advanced microscopy and analytical techniques to investigate nanoscale structure–property relationships and support the development of next-generation materials for energy, catalysis, and environmental applications.
Email: ahmed.abdellah1@ucalgary.ca
Dr. Rad Sadri
XPS Specialist | Research Scientist
Rad is the XPS Specialist for the AXEL facility at the University of Calgary, where he supports academic researchers, external collaborators, startups, and industry partners with advanced surface-analysis services using the Thermo Scientific ESCALAB QXi XPS Microprobe. He has extensive research experience in materials characterization, carbon-based materials, graphene-based composites, catalysts, and materials for electrochemical energy systems. His characterization experience spans a broad range of techniques, including X-ray Photoelectron Spectroscopy (XPS), Raman spectroscopy, X-ray diffraction (XRD), Fourier-transform infrared spectroscopy (FTIR), UV–Visible spectroscopy, X-ray fluorescence spectroscopy (XRF), and related materials characterization methods.
Email: rad.sadri@ucalgary.ca
Location
Advanced X-ray & Electron Laboratory (AXEL)
University Research Centre (URC)
3535 Research Rd NW
Calgary, AB T2L 2K8