XRF Microscope

 Micro-XRF for elemental mapping and point analysis. 

Capabilities:

1. Point analysis (1mm)
2. Elemental Mapping (minimum probe 50um)
3. Microbeam
4. XXX resolution
5. Ambient or vacuum
6. Elemental range: xx-yy

Sample Requirements:

• Solid samples
• Flat surfaces preferred
• Dimensional restrictions

Training Requirements:

• No training is available for the XRF. Users may submit samples to be run by the technician.

Submit a Sample:

• Contact Christine Meng to discuss technical requirements and arrange sample drop-off.

• HORIBA XGT 9000 product page
• What is XRF?